Chin. J. Semicond. > 1998, Volume 19 > Issue 3 > 202-205

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表面杂质浓度分布对晶体管负阻特性的影响

裴素华 , 薛成山 and 赵善麒

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    Received: 20 August 2015 Revised: Online: Published: 01 March 1998

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      裴素华, 薛成山, 赵善麒. 表面杂质浓度分布对晶体管负阻特性的影响[J]. 半导体学报(英文版), 1998, 19(3): 202-205.
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      裴素华, 薛成山, 赵善麒. 表面杂质浓度分布对晶体管负阻特性的影响[J]. 半导体学报(英文版), 1998, 19(3): 202-205.

      • Received Date: 2015-08-20

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