Chin. J. Semicond. > 2001, Volume 22 > Issue 2 > 134-139

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Key words: 高性能, 70nmCMOS器件, 源漏延伸区, 氮化栅氧化介质, 锗预无定形注入, 自对准硅化物

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    Received: 19 August 2015 Revised: Online: Published: 01 February 2001

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      徐秋霞, 钱鹤, 殷华湘, 贾林, 季红浩, 陈宝钦, 朱亚江, 刘明. 高性能70nm CMOS器件(英文)[J]. 半导体学报(英文版), 2001, 22(2): 134-139.
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      徐秋霞, 钱鹤, 殷华湘, 贾林, 季红浩, 陈宝钦, 朱亚江, 刘明. 高性能70nm CMOS器件(英文)[J]. 半导体学报(英文版), 2001, 22(2): 134-139.

      • Received Date: 2015-08-19

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