Citation: |
Wang Guoxiong, Yan Xiaolang. Method of Verification for Manufacturing in Sub-Wavelength Design[J]. Journal of Semiconductors, 2006, 27(5): 819-823.
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Wang G X, Yan X L. Method of Verification for Manufacturing in Sub-Wavelength Design[J]. Chin. J. Semicond., 2006, 27(5): 819.
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Method of Verification for Manufacturing in Sub-Wavelength Design
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Abstract
We describe a post resolution-enhancement-technique verification method for use in manufacturing data flow.The goal of the method is to verify whether designs function as intended,or more precisely,whether the printed images are consistent with the design intent.The process modeling is described for the model-based verification method.The performance of the method is demonstrated by experiment -
References
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