J. Semicond. > 2008, Volume 29 > Issue 12 > 2389-2392

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Performance and Design of GaN-Based Transferred-Electron Devices

Shao Xianjie, Lu Hai, Zhang Rong, Zheng Youdou and Li Zhonghui

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Abstract: Based on the basic transit-time domain operation mode of TEDs,we first calculated the ideal maximum oscillation frequency of GaN-based transferred-electron devices (TEDs),which can be as high as 4.7THz.This value is nearly 8 times as high as that of GaAs-based TEDs,which is about 0.6 THz.Next,we calculated the maximum output power of GaN-based TEDs indicating that GaN-based TEDs are promising for high microwave power applications.We also discussed the two critical conditions in GaN-based design for generating stable Gunn oscillations in transit-time domain mode.Our calculation indicates that the product of electron concentration and the length of active layer should be higher than a critical value of 6.3E12cm-2 ;and the doping lever of the active layer has to be smaller than a critical level of 3.2E17cm-3.This study suggests that GaN-based TEDs have significant advantages for high-frequency and high-power microwave generation,which are perspective for high-power THz signal source applications.

Key words: GaNtransferred-electron devicenegative differential resistance effectmaximum oscillation frequencycritical doping concentration

1

Chemical mechanical polishing of freestanding GaN substrates

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Journal of Semiconductors, 2009, 30(2): 023003. doi: 10.1088/1674-4926/30/2/023003

2

Effect of a Metal Buffer Layer on GaN Grown on Si(111) by Gas Source Molecular Beam Epitaxy with Ammonia

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Journal of Semiconductors, 2008, 29(10): 1998-2002.

3

Influences of N2 Flow Rate on the Crystalline Characteristics of GaN Films Deposited on Glass Substrate at Low Temperature

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Journal of Semiconductors, 2008, 29(12): 2376-2380.

4

Effects of in situ Annealing on Optical and Structural Properties of GaN Epilayers Grown by HVPE

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Journal of Semiconductors, 2008, 29(3): 410-413.

5

Influence of Threading Dislocations on the Luminescence Efficiency of GaN Heteroepitaxial Layers

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Journal of Semiconductors, 2008, 29(3): 521-525.

6

A High Performance AlGaN/GaN HEMT with a New Method for T-Gate Layout Design

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7

Negative Persistent Photoconductivity in Unintentionally Doped n-Type GaN

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Chinese Journal of Semiconductors , 2007, 28(6): 878-882.

8

Growth and Stress Analysis of a-Plane GaN Films Grown on r-Plane Sapphire Substrate with a Two-Step AlN Buffer Layer

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Chinese Journal of Semiconductors , 2007, 28(10): 1562-1567.

9

Numerical Simulation of Gas Phase and Surface Reaction for Growth of GaN by MOCVD

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Chinese Journal of Semiconductors , 2007, 28(S1): 245-248.

10

Growth of Thick GaN Films on Mixed-Polarity Buffer by Halide Vapor Phase Epitaxy

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11

Observation of Dislocation Etch Pits in GaN Epilayers by Atomic Force Microscopy and Scanning Electron Microscopy

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Chinese Journal of Semiconductors , 2007, 28(4): 473-479.

12

Growth of GaN on Si(1 l 1) by Inserting 5AI/AIN Buffer Layer

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13

Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth

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14

GaAs/GaN Direct Wafer Bonding Based on Hydrophilic Surface Treatment

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15

Optimization of the Electron Blocking Layer in GaN Laser Diodes

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16

0.25μm Gate-Length AlGaN/GaN Power HEMTs on Sapphire with fT of 77GHz

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17

Characteristics of npn AlGaN/GaN HBT

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18

Dislocation Reduction in GaN on Sapphire by Epitaxial Lateral Overgrowth

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19

Investigation of Undoped AlGaN/GaN Microwave Power HEMT

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Chinese Journal of Semiconductors , 2005, 26(S1): 151-154.

20

Epitaxial Lateral Overgrowth of High Quality GaN by MOCVD

Chen Jun, Zhang Jicai, Zhang Shuming, Zhu Jianjun, Yang Hui, et al.

Chinese Journal of Semiconductors , 2005, 26(S1): 106-108.

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    Shao Xianjie, Lu Hai, Zhang Rong, Zheng Youdou, Li Zhonghui. Performance and Design of GaN-Based Transferred-Electron Devices[J]. Journal of Semiconductors, 2008, 29(12): 2389-2392.
    Shao X J, Lu H, Zhang R, Zheng Y D, Li Z H. Performance and Design of GaN-Based Transferred-Electron Devices[J]. J. Semicond., 2008, 29(12): 2389.
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    Received: 18 August 2015 Revised: 22 July 2008 Online: Published: 01 December 2008

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      Shao Xianjie, Lu Hai, Zhang Rong, Zheng Youdou, Li Zhonghui. Performance and Design of GaN-Based Transferred-Electron Devices[J]. Journal of Semiconductors, 2008, 29(12): 2389-2392. ****Shao X J, Lu H, Zhang R, Zheng Y D, Li Z H. Performance and Design of GaN-Based Transferred-Electron Devices[J]. J. Semicond., 2008, 29(12): 2389.
      Citation:
      Shao Xianjie, Lu Hai, Zhang Rong, Zheng Youdou, Li Zhonghui. Performance and Design of GaN-Based Transferred-Electron Devices[J]. Journal of Semiconductors, 2008, 29(12): 2389-2392. ****
      Shao X J, Lu H, Zhang R, Zheng Y D, Li Z H. Performance and Design of GaN-Based Transferred-Electron Devices[J]. J. Semicond., 2008, 29(12): 2389.

      Performance and Design of GaN-Based Transferred-Electron Devices

      • Received Date: 2015-08-18
      • Accepted Date: 2008-06-04
      • Revised Date: 2008-07-22
      • Published Date: 2008-12-09

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