
PAPERS
Shao Xianjie, Lu Hai, Zhang Rong, Zheng Youdou and Li Zhonghui
Abstract: Based on the basic transit-time domain operation mode of TEDs,we first calculated the ideal maximum oscillation frequency of GaN-based transferred-electron devices (TEDs),which can be as high as 4.7THz.This value is nearly 8 times as high as that of GaAs-based TEDs,which is about 0.6 THz.Next,we calculated the maximum output power of GaN-based TEDs indicating that GaN-based TEDs are promising for high microwave power applications.We also discussed the two critical conditions in GaN-based design for generating stable Gunn oscillations in transit-time domain mode.Our calculation indicates that the product of electron concentration and the length of active layer should be higher than a critical value of 6.3E12cm-2 ;and the doping lever of the active layer has to be smaller than a critical level of 3.2E17cm-3.This study suggests that GaN-based TEDs have significant advantages for high-frequency and high-power microwave generation,which are perspective for high-power THz signal source applications.
Key words: GaN, transferred-electron device, negative differential resistance effect, maximum oscillation frequency, critical doping concentration
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Chemical mechanical polishing of freestanding GaN substrates Yan Huaiyue, Xiu Xiangqian, Liu Zhanhui, Zhang Rong, Hua Xuemei, et al. Journal of Semiconductors, 2009, 30(2): 023003. doi: 10.1088/1674-4926/30/2/023003 |
2 |
Lin Guoqiang, Zeng Yiping, Wang Xiaoliang, Liu Hongxin Journal of Semiconductors, 2008, 29(10): 1998-2002. |
3 |
Wang Wenyan, Qin Fuwen, Wu Aimin, Song Shiwei, Liu Ruixian, et al. Journal of Semiconductors, 2008, 29(12): 2376-2380. |
4 |
Effects of in situ Annealing on Optical and Structural Properties of GaN Epilayers Grown by HVPE Duan Chenghong, Qiu Kai, Li Xinhua, Zhong Fei, Yin Zhijun, et al. Journal of Semiconductors, 2008, 29(3): 410-413. |
5 |
Influence of Threading Dislocations on the Luminescence Efficiency of GaN Heteroepitaxial Layers Gao Zhiyuan, Hao Yue, Li Peixian, Zhang Jincheng Journal of Semiconductors, 2008, 29(3): 521-525. |
6 |
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7 |
Negative Persistent Photoconductivity in Unintentionally Doped n-Type GaN Su Zhiguo, Xu Jintong, Chen Jun, Li Xiangyang, Liu Ji, et al. Chinese Journal of Semiconductors , 2007, 28(6): 878-882. |
8 |
Yan Jianfeng, Zhang Jie, Guo Liwei, Zhu Xueliang, Peng Mingzeng, et al. Chinese Journal of Semiconductors , 2007, 28(10): 1562-1567. |
9 |
Numerical Simulation of Gas Phase and Surface Reaction for Growth of GaN by MOCVD Gao Lihua, Yang Yunke, Chen Haixin, Fu Song Chinese Journal of Semiconductors , 2007, 28(S1): 245-248. |
10 |
Growth of Thick GaN Films on Mixed-Polarity Buffer by Halide Vapor Phase Epitaxy Yin Zhijun, Zhong Fei, Qiu Kai, Li Xinhua, Wang Yuqi, et al. Chinese Journal of Semiconductors , 2007, 28(6): 909-912. |
11 |
Gao Zhiyuan, Hao Yue, Zhang Jincheng, Zhang Jinfeng, Chen Haifeng, et al. Chinese Journal of Semiconductors , 2007, 28(4): 473-479. |
12 |
Growth of GaN on Si(1 l 1) by Inserting 5AI/AIN Buffer Layer Guo Lunchun, Wang Xiaoliang, Hu Guoxin, Li Jianping, Luo Weijun, et al. Chinese Journal of Semiconductors , 2007, 28(S1): 234-237. |
13 |
Theoretical Simulation of Vertical HVPE Reactor and GaN Thick Film Growth Ma Ping, Duan Yao, Wei Tongbo, Duan Ruifei, Wang Junxi, et al. Chinese Journal of Semiconductors , 2007, 28(S1): 253-256. |
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GaAs/GaN Direct Wafer Bonding Based on Hydrophilic Surface Treatment Wang Hui, Guo Xia, Liang Ting, Liu Shiwen, Gao Guo, et al. Chinese Journal of Semiconductors , 2006, 27(6): 1042-1045. |
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0.25μm Gate-Length AlGaN/GaN Power HEMTs on Sapphire with fT of 77GHz Zheng Yingkui, Liu Guoguo, He Zhijing, Liu Xinyu, Wu Dexin, et al. Chinese Journal of Semiconductors , 2006, 27(6): 963-965. |
17 |
Characteristics of npn AlGaN/GaN HBT Gong Xin, Ma Lin, Zhang Xiaoju, Zhang Jinfeng, Yang Yan, et al. Chinese Journal of Semiconductors , 2006, 27(9): 1600-1603. |
18 |
Dislocation Reduction in GaN on Sapphire by Epitaxial Lateral Overgrowth Chen Jun, Wang Jianfeng, Wang Hui, Zhao Degang, Zhu Jianjun, et al. Chinese Journal of Semiconductors , 2006, 27(3): 419-424. |
19 |
Investigation of Undoped AlGaN/GaN Microwave Power HEMT Zeng Qingming, Li Xianjie, Zhou Zhou, Wang Yong, Wang Xiaoliang, et al. Chinese Journal of Semiconductors , 2005, 26(S1): 151-154. |
20 |
Epitaxial Lateral Overgrowth of High Quality GaN by MOCVD Chen Jun, Zhang Jicai, Zhang Shuming, Zhu Jianjun, Yang Hui, et al. Chinese Journal of Semiconductors , 2005, 26(S1): 106-108. |
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Received: 18 August 2015 Revised: 22 July 2008 Online: Published: 01 December 2008
Citation: |
Shao Xianjie, Lu Hai, Zhang Rong, Zheng Youdou, Li Zhonghui. Performance and Design of GaN-Based Transferred-Electron Devices[J]. Journal of Semiconductors, 2008, 29(12): 2389-2392.
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Shao X J, Lu H, Zhang R, Zheng Y D, Li Z H. Performance and Design of GaN-Based Transferred-Electron Devices[J]. J. Semicond., 2008, 29(12): 2389.
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