Chin. J. Semicond. > 2006, Volume 27 > Issue 1 > 9-13

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Design and Fabrication of Power Si1-xGex/Si Heterojunction Bipolar Transistor for Wireless Power Amplifier Applications

Xue Chunlai, Cheng Buwen, Yao Fei and Wang Qiming

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Abstract: A multi-finger structure power SiGe HBT device (with an emitter area of about 166μm2) is fabricated with very simple 2μm double-mesa technology.The DC current gain β is 14425.The B-C junction breakdown voltage reaches 9V with a collector doping concentration of 1×1017cm-3 and a collector thickness of 400nm.Though our data are influenced by large additional RF probe pads,the device exhibits a maximum oscillation frequency fmax of 101GHz and a cut-off frequency fT of 18GHz at a DC bias point of IC=10mA and VCE=25V.

Key words: SiGeHBTpowerRF

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    Received: 20 August 2015 Revised: Online: Published: 01 January 2006

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      Xue Chunlai, Cheng Buwen, Yao Fei, Wang Qiming. Design and Fabrication of Power Si1-xGex/Si Heterojunction Bipolar Transistor for Wireless Power Amplifier Applications[J]. Journal of Semiconductors, 2006, 27(1): 9-13. ****Xue C L, Cheng B W, Yao F, Wang Q M. Design and Fabrication of Power Si1-xGex/Si Heterojunction Bipolar Transistor for Wireless Power Amplifier Applications[J]. Chin. J. Semicond., 2006, 27(1): 9.
      Citation:
      Xue Chunlai, Cheng Buwen, Yao Fei, Wang Qiming. Design and Fabrication of Power Si1-xGex/Si Heterojunction Bipolar Transistor for Wireless Power Amplifier Applications[J]. Journal of Semiconductors, 2006, 27(1): 9-13. ****
      Xue C L, Cheng B W, Yao F, Wang Q M. Design and Fabrication of Power Si1-xGex/Si Heterojunction Bipolar Transistor for Wireless Power Amplifier Applications[J]. Chin. J. Semicond., 2006, 27(1): 9.

      Design and Fabrication of Power Si1-xGex/Si Heterojunction Bipolar Transistor for Wireless Power Amplifier Applications

      • Received Date: 2015-08-20

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