Chin. J. Semicond. > 1999, Volume 20 > Issue 2 > 139-142
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电导法测量Si_(1-x)Ge_x/Si量子阱的能带偏移

张胜坤 , 蒋最敏 , 秦捷 , 林峰 , 胡冬枝 , 裴成文 and 陆方

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    Received: 20 August 2015 Revised: Online: Published: 01 February 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(2): 139-142
      张胜坤, 蒋最敏, 秦捷, 林峰, 胡冬枝, 裴成文, 陆方. 电导法测量Si_(1-x)Ge_x/Si量子阱的能带偏移[J]. 半导体学报(英文版), 1999, 20(2): 139-142.
      Citation:
      张胜坤, 蒋最敏, 秦捷, 林峰, 胡冬枝, 裴成文, 陆方. 电导法测量Si_(1-x)Ge_x/Si量子阱的能带偏移[J]. 半导体学报(英文版), 1999, 20(2): 139-142.
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      • Received Date: 2015-08-20

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