Chin. J. Semicond. > 1992, Volume 13 > Issue 1 > 28-35
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用正偏电容测量研究SBD的界面态

陈弘毅

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    Received: 19 August 2015 Revised: Online: Published: 01 January 1992

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      Article Navigation >  Journal of Semiconductors  > 1992  >  13(1): 28-35
      陈弘毅. 用正偏电容测量研究SBD的界面态[J]. 半导体学报(英文版), 1992, 13(1): 28-35.
      Citation:
      陈弘毅. 用正偏电容测量研究SBD的界面态[J]. 半导体学报(英文版), 1992, 13(1): 28-35.
      shu

      • Received Date: 2015-08-19

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