Chin. J. Semicond. > 1996, Volume 17 > Issue 8 > 595-600
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一个检测半导体激光器质量的有效方法

石家纬，金恩顺，李红岩，李正庭，郭树旭，高鼎三，余金中，郭良

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    Received: 18 August 2015 Revised: Online: Published: 01 August 1996

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      Article Navigation >  Journal of Semiconductors  > 1996  >  17(8): 595-600
      石家纬，金恩顺，李红岩，李正庭，郭树旭，高鼎三，余金中，郭良. 一个检测半导体激光器质量的有效方法[J]. 半导体学报(英文版), 1996, 17(8): 595-600.
      Citation:
      石家纬，金恩顺，李红岩，李正庭，郭树旭，高鼎三，余金中，郭良. 一个检测半导体激光器质量的有效方法[J]. 半导体学报(英文版), 1996, 17(8): 595-600.
      shu

      • Received Date: 2015-08-18

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