Citation: |
Wang Tao, Yang Ge, Zeng Dongmei, Xu Yadong, Jie Wanqi. Study on the Composition Deviations in CZT Crystal Grown by MVB Method[J]. Journal of Semiconductors, 2007, 28(S1): 345-347.
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Wang T, Yang G, Zeng D M, Xu Y D, Jie W Q. Study on the Composition Deviations in CZT Crystal Grown by MVB Method[J]. Chin. J. Semicond., 2007, 28(S1): 345.
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Study on the Composition Deviations in CZT Crystal Grown by MVB Method
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Abstract
This paper focuses on the composition deviations in Cd0.96 Zn0.04 Te crystal grown by MVB method and its influ. ences on the crystal properties.The composition distributions were measured by X-ray energy spectrometer.The results showed that the values of(Cd+Zn)/Te are greater than 1 in the initial part of CZT ingot and decreased along the axis, which proves that there are still composition deviations in CZT crystal.The ingot was grown from the Cd-rieh melt in the first-to-freeze region and from the Te-rich melt in the last·to-freeze region.The photoluminescence spectra show that there exists higher Te vacancy in Cd-rich CZT wafers and higher Cd vacancy and related defects in Te-rich CZT wafers.IR trans. mittance measurements indicate that higher deviation from the stoichiometric composition corresponds with lower IR transmittance.-
Keywords:
- CdZnTe,
- stoichiometric deviation,
- PL spectra
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References
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