Chin. J. Semicond. > 2007, Volume 28 > Issue 11 > 1722-1728

PAPERS

A Model for Mechanical Property Evaluation of the PeriodicPorous Low-k Materials by SAW

Li Zhiguo, Yao Suying, Xiao Xia and Bai Maosen

+ Author Affiliations

PDF

Abstract: The influence of the distribution of nano-pores on the mechanical properties evaluation of porous low-k films by surface acoustic waves (SAW) is studied.A theoretical SAW propagation model is set up to characterize the periodic porous dielectrics by transversely isotropic symmetry.The theoretical deductions of SAW propagating in the low-k film/Si substrate layered structure are given in detail.The dispersive characteristics of SAW in different propagation directions and the effects of the Young’s moduli E,E′ and shear modulus G′ of the films on these dispersive curves are found.Computational results show that E′ and G′ cannot be measured along the propagation direction that is perpendicular to the nano-pores’ direction.

Key words: periodic porous materialslow-k dielectricstransversely isotropic symmetrymechanical propertySAW measurement

  • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 3182 Times PDF downloads: 2374 Times Cited by: 0 Times

    History

    Received: 18 August 2015 Revised: 05 July 2007 Online: Published: 01 November 2007

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Li Zhiguo, Yao Suying, Xiao Xia, Bai Maosen. A Model for Mechanical Property Evaluation of the PeriodicPorous Low-k Materials by SAW[J]. Journal of Semiconductors, 2007, 28(11): 1722-1728. ****Li Z G, Yao S Y, Xiao X, Bai M S. A Model for Mechanical Property Evaluation of the PeriodicPorous Low-k Materials by SAW[J]. Chin. J. Semicond., 2007, 28(11): 1722.
      Citation:
      Li Zhiguo, Yao Suying, Xiao Xia, Bai Maosen. A Model for Mechanical Property Evaluation of the PeriodicPorous Low-k Materials by SAW[J]. Journal of Semiconductors, 2007, 28(11): 1722-1728. ****
      Li Z G, Yao S Y, Xiao X, Bai M S. A Model for Mechanical Property Evaluation of the PeriodicPorous Low-k Materials by SAW[J]. Chin. J. Semicond., 2007, 28(11): 1722.

      A Model for Mechanical Property Evaluation of the PeriodicPorous Low-k Materials by SAW

      • Received Date: 2015-08-18
      • Accepted Date: 2006-11-06
      • Revised Date: 2007-07-05
      • Published Date: 2007-10-24

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return