Chin. J. Semicond. > 1986, Volume 7 > Issue 5 > 516-521
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MBE GaAs/AlAs一维超晶格结构参数的X射线双晶衍射测量

王玉田 and 陈宗圭

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    Received: 20 August 2015 Revised: Online: Published: 01 May 1986

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      Article Navigation >  Journal of Semiconductors  > 1986  >  7(5): 516-521
      王玉田, 陈宗圭. MBE GaAs/AlAs一维超晶格结构参数的X射线双晶衍射测量[J]. 半导体学报(英文版), 1986, 7(5): 516-521.
      Citation:
      王玉田, 陈宗圭. MBE GaAs/AlAs一维超晶格结构参数的X射线双晶衍射测量[J]. 半导体学报(英文版), 1986, 7(5): 516-521.
      shu

      • Received Date: 2015-08-20

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