Closed Analytical Solution of Breakdown Voltage for Planar Junction and Lateral Curvature Effect

He Jin , Wang Xin and Chen Xingbi

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Received: 20 August 2015 Revised: Online: Published: 01 September 1999

Article Navigation > Journal of Semiconductors > 1999 > 20(9): 753-758

He Jin, Wang Xin, Chen Xingbi. Closed Analytical Solution of Breakdown Voltage for Planar Junction and Lateral Curvature Effect[J]. 半导体学报(英文版), 1999, 20(9): 753-758.

Citation:

He Jin, Wang Xin, Chen Xingbi. Closed Analytical Solution of Breakdown Voltage for Planar Junction and Lateral Curvature Effect[J]. 半导体学报(英文版), 1999, 20(9): 753-758.

He Jin, Wang Xin, Chen Xingbi. Closed Analytical Solution of Breakdown Voltage for Planar Junction and Lateral Curvature Effect[J]. 半导体学报(英文版), 1999, 20(9): 753-758.

Citation:

He Jin, Wang Xin, Chen Xingbi. Closed Analytical Solution of Breakdown Voltage for Planar Junction and Lateral Curvature Effect[J]. 半导体学报(英文版), 1999, 20(9): 753-758.

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