| Citation: |
Yuzhen Zheng, Zhiwei Sun, Tong Xu, Bolin Zhou, Xiaoqi Yu, Xinrui Wang, Junfei Wang, Yongchen Miao, Suman Xia, Zhi Liu, Zengcheng Li, Pengyan Wen, Kanglin Xiong, Jianping Liu, Huaibing Wang, Hui Yang. Low-threshold GaN surface emitting lasers: A comparative study of circular grating and photonic crystal designs[J]. Journal of Semiconductors, 2026, In Press. doi: 10.1088/1674-4926/25120001
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Y Z Zheng, Z W Sun, T Xu, B L Zhou, X Q Yu, X R Wang, J F Wang, Y C Miao, S M Xia, Z Liu, Z C Li, P Y Wen, K L Xiong, J P Liu, H B Wang, and H Yang, Low-threshold GaN surface emitting lasers: A comparative study of circular grating and photonic crystal designs[J]. J. Semicond., 2026, accepted doi: 10.1088/1674-4926/25120001
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Low-threshold GaN surface emitting lasers: A comparative study of circular grating and photonic crystal designs
DOI: 10.1088/1674-4926/25120001
CSTR: 32376.14.1674-4926.25120001
More Information-
Abstract
We demonstrate room-temperature pulsed lasing of two types of GaN-based surface emitting lasers (SEL) fabricated without epitaxial regrowth. We present a direct comparison between a circular grating (CGSEL) and a photonic crystal (PCSEL) design. The devices are realized by etching the photonic structures directly into the p-GaN cladding, and utilizing a patterned Indium Tin Oxide (ITO) top contact. Both designs exhibit lasing near 438 nm under pulsed current injection. The CGSEL, incorporating a central defect, achieves a low threshold current density (<1 kA/cm2) and a small divergence angle (≈0.15°) by coupling to a bandgap defect mode. In contrast, the PCSEL shows a higher threshold current density and lases on a 1D band-edge mode, resulting in a cross-shaped far-field pattern. These results confirm the regrowth-free method as a viable route for manufacturable GaN SELs. Crucially, the comparative study identifies the CGSEL defect-mode design as a more robust path toward high-performance lasing in low-confinement epitaxial structures. -
References
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