1 |
Disordered wall arrays by photo-assisted electrochemical etching in n-type silicon
Yaohu Lei, Zhigang Zhao, Jinchuan Guo, Ji Li, Hanben Niu, et al.
Journal of Semiconductors, 2016, 37(10): 106001. doi: 10.1088/1674-4926/37/10/106001
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2 |
Progress in complementary metal-oxide-semiconductor silicon photonics and optoelectronic integrated circuits
Hongda Chen, Zan Zhang, Beiju Huang, Luhong Mao, Zanyun Zhang, et al.
Journal of Semiconductors, 2015, 36(12): 121001. doi: 10.1088/1674-4926/36/12/121001
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3 |
The micro morphology correction function of a silicon wafer CMP surface
Haokun Yang, Yuling Liu, Ming Sun, Yingde Li
Journal of Semiconductors, 2014, 35(5): 053002. doi: 10.1088/1674-4926/35/5/053002
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4 |
Dynamic threshold voltage operation in Si and SiGe source junctionless tunnel field effect transistor
Shibir Basak, Pranav Kumar Asthana, Yogesh Goswami, Bahniman Ghosh
Journal of Semiconductors, 2014, 35(11): 114001. doi: 10.1088/1674-4926/35/11/114001
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5 |
Analytical modeling and simulation of germanium single gate silicon on insulator TFET
T. S. Arun Samuel, N. B. Balamurugan
Journal of Semiconductors, 2014, 35(3): 034002. doi: 10.1088/1674-4926/35/3/034002
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6 |
Effect of magnesium doping on the light-induced hydrophilicity of ZnO thin films
Huang Kai, Lü Jianguo, Zhang Li, Tang Zhen, Yu Jiangying, et al.
Journal of Semiconductors, 2012, 33(5): 053003. doi: 10.1088/1674-4926/33/5/053003
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7 |
Stacking fault energy in some single crystals
Aditya M.Vora
Journal of Semiconductors, 2012, 33(6): 062001. doi: 10.1088/1674-4926/33/6/062001
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8 |
Effects of vacancy structural defects on the thermal conductivity of silicon thin films
Zhang Xingli, Sun Zhaowei
Journal of Semiconductors, 2011, 32(5): 053002. doi: 10.1088/1674-4926/32/5/053002
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9 |
Optical and electrical properties of porous silicon layer formed on the textured surface by electrochemical etching
Ou Weiying, Zhao Lei, Diao Hongwei, Zhang Jun, Wang Wenjing, et al.
Journal of Semiconductors, 2011, 32(5): 056002. doi: 10.1088/1674-4926/32/5/056002
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10 |
Optimization of the acid leaching process by using an ultrasonic field for metallurgical grade silicon
Zhang Jian, Li Tingju, Ma Xiaodong, Luo Dawei, Liu Ning, et al.
Journal of Semiconductors, 2009, 30(5): 053002. doi: 10.1088/1674-4926/30/5/053002
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11 |
Effect of chemical polish etching and post annealing on the performance of silicon heterojunction solar cells
Jiang Zhenyu, Dou Yuhua, Zhang Yu, Zhou Yuqin, Liu Fengzhen, et al.
Journal of Semiconductors, 2009, 30(8): 084010. doi: 10.1088/1674-4926/30/8/084010
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12 |
An Improved Angle Polishing Method for Measuring Subsurface Damage in Silicon Wafers
Huo Fengwei, Kang Renke, Guo Dongming, Zhao Fuling, Jin Zhuji, et al.
Chinese Journal of Semiconductors , 2006, 27(3): 506-510.
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13 |
Fabrication and Evaluation of Bragg Gratings on Optimally Designed Silicon-on-Insulator Rib Waveguides Using Electron-Beam Lithography
Wu Zhigang, Zhang Weigang, Wang Zhi, Kai Guiyun, Yuan Shuzhong, et al.
Chinese Journal of Semiconductors , 2006, 27(8): 1347-1350.
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14 |
MEMS Inductor Consisting of Suspended Thick Crystalline Silicon Spiral with Copper Surface Coating
Wu Wengang, Li Yi, Huang Fengyi, Han Xiang, Zhang Shaoyong, et al.
Chinese Journal of Semiconductors , 2006, 27(4): 662-666.
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15 |
An Analytical Model for the Surface Electrical Field Distribution and Optimization of Bulk-Silicon Double RESURF Devices
Li Qi, Li Zhaoji, Zhang Bo
Chinese Journal of Semiconductors , 2006, 27(7): 1177-1182.
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16 |
Analysis of PTCDA/ITO Surface and Interface Using X-ray Photoelectron Spectroscopy and Atomic Force Microscopy
Tang Ning, Shen Bo, Wang Maojun, Yang Zhijian, Xu Ke, et al.
Chinese Journal of Semiconductors , 2006, 27(2): 235-238.
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17 |
Analysis of PTCDA/ITO Surface and Interface Using X-ray Photoelectron Spectroscopy and Atomic Force Microscopy
Ou Guping, Song Zhen, Gui Wenming, Zhang Fujia
Chinese Journal of Semiconductors , 2006, 27(2): 229-234.
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18 |
Effect of Nickel Contamination on Formation of Denuded Zone in Czochralski Silicon
Wu Dongdong, Yang Deren, Xi Zhenqiang, Que Duanlin, Zhong Yao, et al.
Chinese Journal of Semiconductors , 2006, 27(4): 623-626.
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19 |
Mn-Si Films Fabricated by Low Energy Ion Beam Deposition
Liu Lifeng, Chen Nuofu, Chai Chunlin, Yang Shaoyan, Liu Zhikai, et al.
Chinese Journal of Semiconductors , 2005, 26(S1): 94-97.
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20 |
A Novel Local-Dielectric-Thickening Technique for Performance Improvements of Spiral Inductors on Si Substrates
Chinese Journal of Semiconductors , 2005, 26(5): 857-861.
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