Processing math: 100%
J. Semicond. > 2013, Volume 34 > Issue 9 > 095006

SEMICONDUCTOR INTEGRATED CIRCUITS

W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology

Hongfei Yao, Xiantai Wang, Danyu Wu, Yongbo Su, Yuxiong Cao, Ji Ge, Xiaoxi Ning and Zhi Jin

+ Author Affiliations

 Corresponding author: Jin Zhi, Email:jinzhi@ime.ac.cn

DOI: 10.1088/1674-4926/34/9/095006

PDF

Abstract: A W-band frequency doubler MMIC is designed and fabricated using 1-μm InP DHBT technology. Active balun is employed to transform the single-ended signal into differential output. Push-push configuration loaded with harmonic resonant network is utilized to acquire the second harmonic frequency. A multi-stage differential structure improves the conversion gain and suppresses the fundamental frequency. The MMIC occupies an area of 0.55×0.5 mm2 with 18 DHBTs integrated. Measurements show that the output power is above 5.8 dBm with the suppression of fundamental frequency below -16 dBc and the conversion gain above 4.7 dB over 75-80 GHz.

Key words: frequency doublerW-bandInPDHBTpush-push

Frequency multiplier, and in particular frequency doubler, is widely used in millimeter-wave signal sources and transceivers. It can be used to extend the frequency range of microwave signal sources up to millimeter-wave band while maintaining the performances of the microwave signal sources, such as high stability and low phase noise[1]. As frequency increases from microwave to millimeter-wave, the influence of the parasites in devices and passive structures become dramatically stronger. Therefore, the design of a W-band doubler presents remarkable challenges and specific methodology should be applied.

A traditional distributed diode multiplier often occupies large areas and requires high driving power[2, 3]. Nowadays, the progress of semiconductor technologies based on both specific materials and proper scaling of devices enables us to concentrate on the design using the current-source biased differential pairs in MMIC.

In this paper, the authors present the design, fabrication, and characterization of a MMIC frequency doubler which theoretically operates from 75 to 110 GHz (due to the upper-frequency limit of the signal source, the doubler was characterized with the frequency only to 80 GHz). To implement the frequency doubler, an active differential balun is chosen to convert the single-ended input to differential output. The final push-push stage performs frequency doubling and suppresses the fundamental frequency. This differential-pair architecture allows us to achieve good fundamental signal rejection and fairly high output power. Multi-stage differential structure improves the conversion gain and diminishes the impact of the active balun's unbalance on the circuit performances.

The InP double heterojunction bipolar transistor (DHBT) technology, used for doubler fabrication, is presented, and the doubler design is given.

The transistor is grown on 3-inch InP wafer with an epitaxial profile designed for high frequency application. S-parameter measurements of the 1 × 15 μm2 HBT demonstrates an extrapolated fT (current gain cutoff frequency) of 170 GHz and an extrapolated maximum oscillation frequency fmax of 253 GHz at the bias of IC = 15.4 mA and VCE = 1.5 V[4, 5]. The large-signal model for InP/InGaAs DHBTs has been implemented as a symbolically defined device (SDD)[6] in the Agilent ADS simulator.

The InP DHBT IC process includes MIM capacitor, thin-film resistors (50 Ω/), 2-levels of interconnect (M1, M2), benzocyclobutene (BCB) passivating devices, and the wafer planarization after device formation, as shown in Fig. 1. A coplanar waveguide (CPW) is employed for its widely controllable impedance, ease of fabrication, and ability to maintain signal integrity at very high frequencies within dense mixed-signal ICs.

Figure  1.  Progress cross section of InP DHBTs technology.

The frequency doubler is based on a push-push cell which outputs the second harmonic wave and suppresses the fundamental power. Frequency doubling results in generating harmonics due to nonlinear characteristics of the transistors in the push-push structure[7] and the former common-emitter stage working under large-signal condition.

A detailed electrical scheme of the proposed doubler IC is illustrated in Fig. 2.

Figure  2.  Electrical scheme of frequency doubler.

The chip consists of five building blocks such as current mirror, active balun, differential amplifier, emitter follower and push-push core. The current sources are used to bias the emitter followers and differential pairs. For differential structure, this presents high common-mode impedance and improves the common-mode rejection ratio. The single-ended input is first transformed into differential output by the active balun and amplified by the following common-emitter stage. Then, the amplified signals are buffered by the emitter follower and used to drive the push-push frequency doubling core.

Negative bias VEE is employed so that the collectors of Q3-Q10 can connect to ground instead of DC bias lines. In this way the influence of the bias network on the RF path is minimized. Active differential balun instead of passive balun is used by virtue of its compact size. The balun loses its amplitude and phase balance as frequency increases since the bases of Q3, Q4 see different impedances when the signal source is connected[8]. Following the differential balun, the common-emitter differential amplifier and the emitter follower help to diminish this mismatch. Also the emitter follower stages realize a level shifting and impedance matching to the next stage. Transmission lines T1, T2 provide an impedance match for fundamental frequency and can also reflect back the harmonic frequencies coming from the doubling stages.

Frequency multiplication occurs in the push-push core, as shown in Fig. 3. Q9 and Q10 are biased close to class-B (VBE = 0.82 V), serving as the doubling core. The harmonic component of collector current is a function of conduction angle, which can be controlled by the input driving power and the base bias point[9]. The collector current can be modeled as a train of rectified cosine pulses as shown in Fig. 4and using the Fourier series expansion, it can be represented as[10]

Figure  3.  Frequency doubling core based on push-push configuration.
Figure  4.  Collector current modeled as a train of rectified cosine pulses.

Ic(t)=I0+I1cos(ω1t)+I2cos(2ωt)++Incos(nωt)+,

(1)

I0=Imax4t0πT,

(2)

In=0,foroddn,

(3)

In=Imax8t0πT(cosnπt0T)[1(2nt0T)2]1,forevenn.

(4)

Imax is the maximum current, t0 is the length of the pulse, and T is the period corresponding to the fundamental frequency. To maximize the amplitude of the second harmonic, the conduction duty cycle for each transistor should be chosen such as t0/T = 32%[9]. However, this would sacrifice the valuable gain at W-band. As a compromise, Q9, Q10 were each biased with t0/T about 50%. Simulation of the push-push core is shown in Fig. 2and we show the collector currents IC1, IC2 in Fig. 5. Q9 and Q10 turn on alternately and at the output node the circuit delivers the even-order harmonic current or voltage, as shown in Fig. 6. The fundamental leakage is due to the non-ideal differential characteristics of the signals at the two bases of Q9 Q10. This comes from the imbalance of the active balun.

Figure  5.  The collector currents of Q9, Q10.
Figure  6.  Total collector current of the two transistors Q9, Q10 (Ic1+Ic2).

Current mirrors act as stable current sources. The parallel short-ended stub T3 with electrical length of 24 @ 2f0 (f0 = 90 GHz) at the common collector node implement the simple impedance match for the doubling frequency. T3 can also ground the fundamental frequency f0 thus improving the fundamental suppression.

All transistors have a size of 1 × 15 μm2, which is a good compromise between fT and RF power. Q1, Q2 are biased at 5 mA and 7 mA respectively with R1 = 300 Ω, R2 = 120 Ω, R3 = 500 Ω which stabilize the current source in case of environment variation. Q2 helps to reduce the base current influence and improve the output current precision. The individual source for the differential structure is biased at about 14 mA to make full use of the DHBT's gain and power ability.

Due to circuit complexity and wide frequency band of DHBT, circuit stability is an important design issue. When frequency increases toward W-band, the current source loses its high-impedance characteristics and even presents some immittance. Also the parasitic inductances or capacitances of the devices and the interconnecting lines have an even greater impact on the RF performance. Hence, wires connecting the current sources to the differential pairs are modeled as transmission lines in the schematic diagram. Also the stabilizing resistors Rc1, Rc2 are included to eliminate the oscillations. These are shown in Fig. 7.

Figure  7.  The stabilizing resistors and modeled inter-connecting lines between current sources and differential pairs.

All the passive components, including capacitances, resistors and transmission lines, are simulated by momentum electro-magnetic (EM) simulator, and then co-simulated with the nonlinear HBT models in Agilent's advanced design system (ADS) EDA environment to predict the time-domain and frequency-domain output. Figure 8 shows the simulated frequency spectrum and wave form of the output signal when the driving signal is of 40 GHz and 0 dBm.

Figure  8.  Simulated (a) frequency spectrum and (b) wave form of the output signal.

The whole circuit is divided into two parts: RF core and DC bias. The RF core contains four pairs of HBTs Q3-Q10, matching transmission lines T1-T3, and RF input and output ports. The DC part is composed of current mirrors which are used to bias the RF differential pairs.

The signal line is fed via the matched 50 Ω CPW line. Similarly, the output signal is connected to the output pad with a 50 Ω CPW line. The layout is compacted to shorten high-frequency signal paths. The RF core is optimized for minimum wire length and maximum symmetry. VEE feeds the RF transistors through the current mirror sources which isolates the RF core from DC bias lines. The microphotograph is presented in Fig. 9 with a size of 0.55 × 0.5 mm2.

Figure  9.  Microphotograph of the MMIC frequency doubler (0.55 × 0.5 mm2).

The doubler was measured using on-wafer probing and biasing at room temperature, as shown in Fig. 10. The input signal was generated by a signal generator (E8257D) and delivered to the MMIC through coaxial cables. The output signal was delivered to the 18th harmonic mixer through a GGB WR-10 waveguide and down-converted to Ka-band. The output signal was monitored by spectrum analyzer (E4447A) with the frequency value displayed at W-band. The bias voltage VEE for all stages is -3.6 V and the total current IEE is 113 mA. So the power consumption is 407 mW.

Figure  10.  Test setup for on-wafer measurement of the W-band doubler.

Figure 11 gives the output spectrum when the input frequency is 80 GHz. From the displayed noise level and the resolution bandwidth (BW), it can be estimated that the phase noise is about

Figure  11.  Output spectrums of the frequency doubler when the input frequency is 40 GHz.

Noise(dBm)Pout(dBm)10lg(BW(Hz))120dBc/Hz@1MHz,

(5)

which is very close to the theoretical value of the 18th multiplied E8257D signal:

146(dBc/Hz)+20lg18=121(dBc/Hz).

(6)

From Eqs. (5) and (6), it is certain that the additive phase noise of the frequency doubler is trivial and will not aggravate the quality of the input signal.

The output spectrum was also inspected from 10 MHz to 42 GHz to determine the fundamental frequency suppression. When the input power is 0 dBm @ 40 GHz, form Fig. 12, it can be seen that the displayed power of the fundamental frequency is 21.4 dBm. With the 9.5 dB coaxial cable loss taken into account, the actual power of the fundamental frequency is 10.9 dBm.

Figure  12.  Output spectrums of the frequency doubler over 10 MHz-42 GHz when the input frequency is 40 GHz.

Figure 13 shows the measured output power and conversion gain for various input power at 80 GHz. It can be seen that at the vicinity of 7 dBm for input power, the output power began increasing rapidly and the fundamental wave came into compression. This indicates that the doubler was driven effectively and nonlinearity was strengthened. Hence the second harmonic frequency was triggered out. When the input signal reached 2 dBm, conversion gain exceeded 0 dB. With the input power increased further, the output power saturated at about 6 dBm, with the corresponding gain of 5 dB.

Figure  13.  Measured output power, conversion gain and suppression of f0 versus input power at 80 GHz.

The output power and conversion gain are also measured as a function of the input frequency, as shown in Fig. 14. As can be seen, from 75 to 80 GHz, the conversion gain is more than 4.7 dB and output power is higher than 5.8 dBm with gain-ripple less than 0.6 dBpp. The output spectrum with the input frequency swept from 37.5 to 40 GHz was also inspected. The final results are also shown in Fig. 14. As can be seen, suppression of the fundamental frequency is below -16 dBc, which is close to the predicted -19 dBc in Fig. 8. The small-signal S22 is below -6 dB over the whole W band.

Figure  14.  Measured output power and conversion gain over 75-80 GHz.

A comparison of several representative reported W-band frequency doublers is presented in Table 1. Contributing to the low-parasite design of the multi-stage differential structure and high frequency performance of the InP DHBT, the proposed doubler demonstrates the highest conversion gain.

Table  1.  Performance summary and comparison.
DownLoad: CSV  | Show Table

A compact W-band frequency doubler using push-push shaping circuit is proposed. Differential structure improves the common-mode rejection ratio and suppresses fundamental frequency. The multi-stage driving circuit increases the conversion gain and delivers enough power to the push-push core. Low-parasite layouts ensure the desirable RF performance. Due to the frequency limit of the test system, measurements were performed from 75 to 80 GHz and show the output power is higher than 5.8 dBm with conversion gain above 4.7 dB.



[1]
Puyal V, Konczykowska A, Nouet P. DC-100-GHz frequency doublers in InP DHBT technology. IEEE Trans Microw Theory Tech, 2005, 53(4):1338 doi: 10.1109/TMTT.2005.845766
[2]
An D W, Yu W H, Lv X. Design and analysis of a 2 mm-band tripler based on quartz. J Infrared Millim Wave, 2011, 30(4):377
[3]
Yang T, Xiang X J, Wu W. Broad-band tripler of W-band. J Infrared Millim Wave, 2007, 26(3):161 http://en.cnki.com.cn/Article_en/CJFDTOTAL-HWYH200703000.htm
[4]
Jin Z, Su Y B, Cheng W. High current multi-finger InGaAs/InP double heterojunction bipolar transistor with the maximum oscillation frequency 253 GHz. Chin Phys Lett, 2008, 25(8):3075 doi: 10.1088/0256-307X/25/8/091
[5]
Cheng W, Jin Z, Yu J Y. Design of InGaAsP composite collector for InP DHBT. Chinese Journal of Semiconductors, 2007, 28(6):131 doi: 10.1143/JJAP.43.2243/pdf; jsessionid=8799A660736756D1964EA3A7687F8640.c3.iopscience.cld.iop.org
[6]
Cao Y X, Jin Z, Ge J. A symbolically defined InP double heterojunction bipolar transistor large-signal model. Journal of Semiconductors, 2009, 30(12):37 http://www.jos.ac.cn/bdtxbcn/ch/reader/view_abstract.aspx?file_no=09060503&flag=1
[7]
Kobayashi K W, OKI A K, Tran L T. A 108-GHz InP-HBT monolithic push-push VCO with low phase noise and wide tuning bandwidth. IEEE J Solid-State Circuits, 1999, 34(9):1225 doi: 10.1109/4.782080
[8]
Li Q, Wang Z G, Li W. Design of 20-44 GHz broadband doubler MMIC. Journal of Semiconductors, 2010, 31(4):045012 doi: 10.1088/1674-4926/31/4/045012
[9]
Maas S A. Nonlinear microwave and RF circuits. Norwood, MA:Artech House, 2003 http://ci.nii.ac.jp/ncid/BA63628377
[10]
Hung J J, Hancock T M, Rebeiz G M. High-power high-efficiency SiGe Ku-and Ka-band balanced frequency doublers. IEEE Trans Microw Theory Tech, 2005, 53(2):754 doi: 10.1109/TMTT.2004.840615
[11]
Campos-Roca Y, Verweyen L, Fernández-Barciela M. 38/76 GHz PHEMT MMIC balanced frequency doublers in coplanar technology. IEEE Microw Wireless Compon Lett, 2000, 10(11):484 http://cat.inist.fr/?aModele=afficheN&cpsidt=819389
[12]
Liu G, Ulusoy A C, Trasser A. 60-80 GHz frequency doubler operating close to fmax. APMC, 2010:770
Fig. 1.  Progress cross section of InP DHBTs technology.

Fig. 2.  Electrical scheme of frequency doubler.

Fig. 3.  Frequency doubling core based on push-push configuration.

Fig. 4.  Collector current modeled as a train of rectified cosine pulses.

Fig. 5.  The collector currents of Q9, Q10.

Fig. 6.  Total collector current of the two transistors Q9, Q10 (Ic1+Ic2).

Fig. 7.  The stabilizing resistors and modeled inter-connecting lines between current sources and differential pairs.

Fig. 8.  Simulated (a) frequency spectrum and (b) wave form of the output signal.

Fig. 9.  Microphotograph of the MMIC frequency doubler (0.55 × 0.5 mm2).

Fig. 10.  Test setup for on-wafer measurement of the W-band doubler.

Fig. 11.  Output spectrums of the frequency doubler when the input frequency is 40 GHz.

Fig. 12.  Output spectrums of the frequency doubler over 10 MHz-42 GHz when the input frequency is 40 GHz.

Fig. 13.  Measured output power, conversion gain and suppression of f0 versus input power at 80 GHz.

Fig. 14.  Measured output power and conversion gain over 75-80 GHz.

Table 1.   Performance summary and comparison.

[1]
Puyal V, Konczykowska A, Nouet P. DC-100-GHz frequency doublers in InP DHBT technology. IEEE Trans Microw Theory Tech, 2005, 53(4):1338 doi: 10.1109/TMTT.2005.845766
[2]
An D W, Yu W H, Lv X. Design and analysis of a 2 mm-band tripler based on quartz. J Infrared Millim Wave, 2011, 30(4):377
[3]
Yang T, Xiang X J, Wu W. Broad-band tripler of W-band. J Infrared Millim Wave, 2007, 26(3):161 http://en.cnki.com.cn/Article_en/CJFDTOTAL-HWYH200703000.htm
[4]
Jin Z, Su Y B, Cheng W. High current multi-finger InGaAs/InP double heterojunction bipolar transistor with the maximum oscillation frequency 253 GHz. Chin Phys Lett, 2008, 25(8):3075 doi: 10.1088/0256-307X/25/8/091
[5]
Cheng W, Jin Z, Yu J Y. Design of InGaAsP composite collector for InP DHBT. Chinese Journal of Semiconductors, 2007, 28(6):131 doi: 10.1143/JJAP.43.2243/pdf; jsessionid=8799A660736756D1964EA3A7687F8640.c3.iopscience.cld.iop.org
[6]
Cao Y X, Jin Z, Ge J. A symbolically defined InP double heterojunction bipolar transistor large-signal model. Journal of Semiconductors, 2009, 30(12):37 http://www.jos.ac.cn/bdtxbcn/ch/reader/view_abstract.aspx?file_no=09060503&flag=1
[7]
Kobayashi K W, OKI A K, Tran L T. A 108-GHz InP-HBT monolithic push-push VCO with low phase noise and wide tuning bandwidth. IEEE J Solid-State Circuits, 1999, 34(9):1225 doi: 10.1109/4.782080
[8]
Li Q, Wang Z G, Li W. Design of 20-44 GHz broadband doubler MMIC. Journal of Semiconductors, 2010, 31(4):045012 doi: 10.1088/1674-4926/31/4/045012
[9]
Maas S A. Nonlinear microwave and RF circuits. Norwood, MA:Artech House, 2003 http://ci.nii.ac.jp/ncid/BA63628377
[10]
Hung J J, Hancock T M, Rebeiz G M. High-power high-efficiency SiGe Ku-and Ka-band balanced frequency doublers. IEEE Trans Microw Theory Tech, 2005, 53(2):754 doi: 10.1109/TMTT.2004.840615
[11]
Campos-Roca Y, Verweyen L, Fernández-Barciela M. 38/76 GHz PHEMT MMIC balanced frequency doublers in coplanar technology. IEEE Microw Wireless Compon Lett, 2000, 10(11):484 http://cat.inist.fr/?aModele=afficheN&cpsidt=819389
[12]
Liu G, Ulusoy A C, Trasser A. 60-80 GHz frequency doubler operating close to fmax. APMC, 2010:770
1

A THz InGaAs/InP double heterojunction bipolar transistor with fmax=325 GHz and BVCBO=10.6 V

Wei Cheng, Yuan Wang, Yan Zhao, Haiyan Lu, Hanchao Gao, et al.

Journal of Semiconductors, 2013, 34(5): 054006. doi: 10.1088/1674-4926/34/5/054006

2

A 16.9 dBm InP DHBT W-band power amplifier with more than 20 dB gain

Hongfei Yao, Yuxiong Cao, Danyu Wu, Xiaoxi Ning, Yongbo Su, et al.

Journal of Semiconductors, 2013, 34(7): 075005. doi: 10.1088/1674-4926/34/7/075005

3

An 88 nm gate-length In0.53Ga0.47As/In0.52Al0.48As InP-based HEMT with fmax of 201 GHz

Zhong Yinghui, Wang Xiantai, Su Yongbo, Cao Yuxiong, Jin Zhi, et al.

Journal of Semiconductors, 2012, 33(7): 074004. doi: 10.1088/1674-4926/33/7/074004

4

High breakdown voltage InGaAs/InP double heterojunction bipolar transistors with fmax = 256 GHz and BVCEO = 8.3 V

Cheng Wei, Zhao Yan, Gao Hanchao, Chen Chen, Yang Naibin, et al.

Journal of Semiconductors, 2012, 33(1): 014004. doi: 10.1088/1674-4926/33/1/014004

5

An InP-based heterodimensional Schottky diode for terahertz detection

Wen Ruming, Sun Hao, Teng Teng, Li Lingyun, Sun Xiaowei, et al.

Journal of Semiconductors, 2012, 33(10): 104001. doi: 10.1088/1674-4926/33/10/104001

6

An InGaAs/InP 40 GHz CML static frequency divider

Su Yongbo, Jin Zhi, Cheng Wei, Ge Ji, Wang Xiantai, et al.

Journal of Semiconductors, 2011, 32(3): 035008. doi: 10.1088/1674-4926/32/3/035008

7

Ultra high-speed InP/InGaAs DHBTs with ft of 203 GHz

Su Yongbo, Jin Zhi, Cheng Wei, Liu Xinyu, Xu Anhuai, et al.

Journal of Semiconductors, 2009, 30(1): 014002. doi: 10.1088/1674-4926/30/1/014002

8

A Submicron InGaAs/InP Heterojunction Bipolar Transistor with ft of 238GHz

Jin Zhi, Cheng Wei, Liu Xinyu, Xu Anhuai, Qi Ming, et al.

Journal of Semiconductors, 2008, 29(10): 1898-1901.

9

Effect of Deep Traps in Carrier Generation and Transport in Undoped InP Wafers

Zhou Xiaolong, Sun Niefeng, Yang Ruixia, Zhang Weiyu, Sun Tongnian, et al.

Chinese Journal of Semiconductors , 2007, 28(S1): 24-27.

10

InP/InGaAs Heterojunction Bipolar Transistor with Base μ-Bridge and Emitter Air-Bridge

Yu Jinyong, Liu Xinyu, Su Shubing, Wang Runmei, Xu Anhuai, et al.

Chinese Journal of Semiconductors , 2007, 28(2): 154-158.

11

Growth and characterization of InP-based and phosphorous-involved materials for applications to HBTs by GSMBE were studied systematically. High quality 50ram InP-based HBT and 100mm InGaP/GaAs HBT epitaxial materials were obtained through optimizing the HBT structure design and the GSMBE growth condition. It is shown that the HBT devices and circuits with high performance can be achieved by using the epi-wafers grown by the GSMBE technology developed in this work.

Qi Ming, Xu Anhuai, Ai Likun, Sun Hao, Zhu Fuying, et al.

Chinese Journal of Semiconductors , 2007, 28(S1): 182-185.

12

Fabrication of a High-Performance RTD on InP Substrate

Qi Haitao, Feng Zhen, Li Yali, Zhang Xiongwen, Shang Yaohui, et al.

Chinese Journal of Semiconductors , 2007, 28(12): 1945-1948.

13

Growth Modes of InP Epilayers Grown by Solid Source Molecular Beam Epitaxy

Pi Biao, Shu Yongchun, Lin Yaowang, Xu Bo, Yao Jianghong, et al.

Chinese Journal of Semiconductors , 2007, 28(S1): 28-32.

14

Agilent HBT Model Parameters Extraction Procedure For InP HBT’

He Jia, Sun Lingling, Liu Jun

Chinese Journal of Semiconductors , 2007, 28(S1): 443-447.

15

Semi-Insulating Long InP Single Crystal Growth

Sun Niefeng, Mao Luhong, Guo Weilian, Zhou Xiaolong, Yang Ruixia, et al.

Chinese Journal of Semiconductors , 2007, 28(S1): 186-189.

16

Analysis of an InP/InGaAs/InP DHBT with Composite Doping Collector

Sun Hao, Qi Ming, Xu Anhuai, Ai Likun, Su Shubing, et al.

Chinese Journal of Semiconductors , 2006, 27(8): 1431-1435.

17

Activation of Fe Doping and Electrical Compensation in Semi-Insulating InP

Miao Shanshan, Zhao Youwen, Dong Zhiyuan, Deng Aihong, Yang Jun, et al.

Chinese Journal of Semiconductors , 2006, 27(11): 1934-1939.

18

Synthesis and Spectral Properties of InP Colloidal Quantum Dots

Zhang Daoli, Zhang Jianbing, Wu Qiming, Yuan Lin, Chen Sheng, et al.

Chinese Journal of Semiconductors , 2006, 27(7): 1213-1216.

19

Performance of an InP DHBT Grown by MBE

Su Shubing, Liu Xinyu, Xu Anhuai, Yu Jinyong, Qi Ming, et al.

Chinese Journal of Semiconductors , 2006, 27(5): 792-795.

20

GaAsSb/InP HBT Growth on InP Substrates

XU Xian-gang, LIU Zhe, CUI De-liang

Chinese Journal of Semiconductors , 2002, 23(9): 962-965.

  • Search

    Advanced Search >>

    GET CITATION

    Hongfei Yao, Xiantai Wang, Danyu Wu, Yongbo Su, Yuxiong Cao, Ji Ge, Xiaoxi Ning, Zhi Jin. W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology[J]. Journal of Semiconductors, 2013, 34(9): 095006. doi: 10.1088/1674-4926/34/9/095006
    H F Yao, X T Wang, D Y Wu, Y B Su, Y X Cao, J Ge, X X Ning, Z Jin. W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology[J]. J. Semicond., 2013, 34(9): 095006. doi: 10.1088/1674-4926/34/9/095006.
    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 3163 Times PDF downloads: 24 Times Cited by: 0 Times

    History

    Received: 06 February 2013 Revised: 26 March 2013 Online: Published: 01 September 2013

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Hongfei Yao, Xiantai Wang, Danyu Wu, Yongbo Su, Yuxiong Cao, Ji Ge, Xiaoxi Ning, Zhi Jin. W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology[J]. Journal of Semiconductors, 2013, 34(9): 095006. doi: 10.1088/1674-4926/34/9/095006 ****H F Yao, X T Wang, D Y Wu, Y B Su, Y X Cao, J Ge, X X Ning, Z Jin. W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology[J]. J. Semicond., 2013, 34(9): 095006. doi: 10.1088/1674-4926/34/9/095006.
      Citation:
      Hongfei Yao, Xiantai Wang, Danyu Wu, Yongbo Su, Yuxiong Cao, Ji Ge, Xiaoxi Ning, Zhi Jin. W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology[J]. Journal of Semiconductors, 2013, 34(9): 095006. doi: 10.1088/1674-4926/34/9/095006 ****
      H F Yao, X T Wang, D Y Wu, Y B Su, Y X Cao, J Ge, X X Ning, Z Jin. W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology[J]. J. Semicond., 2013, 34(9): 095006. doi: 10.1088/1674-4926/34/9/095006.

      W-band push-push monolithic frequency doubler in 1-μm InP DHBT technology

      DOI: 10.1088/1674-4926/34/9/095006
      Funds:

      Project supported by the National Basic Research Program of China (No. 2010CB327502)

      the National Basic Research Program of China 2010CB327502

      More Information
      • Corresponding author: Jin Zhi, Email:jinzhi@ime.ac.cn
      • Received Date: 2013-02-06
      • Revised Date: 2013-03-26
      • Published Date: 2013-09-01

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return