Citation: |
Genquan Han, Tiangui You, Yibo Wang, Zheng-Dong Luo, Xin Ou, Yue Hao. Heterogeneous integration technology for the thermal management of Ga2O3 power devices[J]. Journal of Semiconductors, 2023, 44(6): 060301. doi: 10.1088/1674-4926/44/6/060301
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Genquan Han, Tiangui You, Yibo Wang, Zheng-Dong Luo, Xin Ou, Yue Hao, Heterogeneous integration technology for the thermal management of Ga2O3 power devices[J]. Journal of Semiconductors, 2023, 44(6), 060301 doi: 10.1088/1674-4926/44/6/060301
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Heterogeneous integration technology for the thermal management of Ga2O3 power devices
DOI: 10.1088/1674-4926/44/6/060301
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References
[1] Barman S K, Huda M N. Mechanism behind the easy exfoliation of Ga2O3 ultra-thin film along (100) surface. Phys Status Solidi RRL, 2019, 13, 1800554 doi: 10.1002/pssr.201800554[2] Cheng Z, Wheeler V D, Bai T Y, et al. Integration of polycrystalline Ga2O3 on diamond for thermal management. Appl Phys Lett, 2020, 116, 062105 doi: 10.1063/1.5125637[3] Li Z M, Jiao T, Yu J Q, et al. Single crystalline β-Ga2O3 homoepitaxial films grown by MOCVD. Vacuum, 2020, 178, 109440 doi: 10.1016/j.vacuum.2020.109440[4] Xu W H, Wang Y B, You T G, et al. First demonstration of waferscale heterogeneous integration of Ga2O3 MOSFETs on SiC and Si substrates by ion-cutting process. 2019 IEEE International Electron Devices Meeting (IEDM). San Francisco, CA, USA. IEEE, 2020, 12.5. 1 doi: 10.1109/IEDM19573.2019.8993501[5] Shen Z H, Xu W H, Chen Y, et al. Wafer-scale single-crystalline β-Ga2O3 thin film on SiC substrate by ion-cutting technique with hydrophilic wafer bonding at elevated temperatures. Sci China Mater, 2023, 66, 756 doi: 10.1007/s40843-022-2187-2[6] Xu W H, You T G, Wang Y B, et al. Efficient thermal dissipation in wafer-scale heterogeneous integration of single-crystalline β-Ga2O3 thin film on SiC. Fundam Res, 2021, 1, 691 doi: 10.1016/j.fmre.2021.11.003[7] Wang Y B, Xu W H, Han G Q, et al. Channel properties of Ga2O3-on-SiC MOSFETs. IEEE Trans Electron Devices, 2021, 68, 1185 doi: 10.1109/TED.2021.3051135[8] Wang Y B, Xu W H, You T G, et al. β-Ga2O3 MOSFETs on the Si substrate fabricated by the ion-cutting process. Sci China Phys Mech Astron, 2020, 63, 277311 doi: 10.1007/s11433-020-1533-0[9] Wang Y B, Xu W H, Han G Q, et al. Channel mobility properties of β-Ga2O3 MOSFETs on Si substrate fabricated by ion-cutting process. 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). Chengdu, China. IEEE, 2021, 1 doi: 10.1109/EDTM50988.2021.9420854[10] Wang Y B, Han G Q, Xu W H, et al. Recessed-gate Ga2O3-on-SiC MOSFETs demonstrating a stable power figure of merit of 100 mW/cm² up to 200 °C. IEEE Trans Electron Devices, 2022, 69, 1945 doi: 10.1109/TED.2022.3154340 -
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