Chin. J. Semicond. > 1987, Volume 8 > Issue 5 > 480-485
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用于测量微小弯曲晶体曲率半径和弯曲方向的(n~v,-m~s)双晶衍射术

陈京一 and 许顺生

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    Received: 19 August 2015 Revised: Online: Published: 01 May 1987

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      Article Navigation >  Journal of Semiconductors  > 1987  >  8(5): 480-485
      陈京一, 许顺生. 用于测量微小弯曲晶体曲率半径和弯曲方向的(n~v,-m~s)双晶衍射术[J]. 半导体学报(英文版), 1987, 8(5): 480-485.
      Citation:
      陈京一, 许顺生. 用于测量微小弯曲晶体曲率半径和弯曲方向的(n~v,-m~s)双晶衍射术[J]. 半导体学报(英文版), 1987, 8(5): 480-485.
      shu

      • Received Date: 2015-08-19

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