Chin. J. Semicond. > 2003, Volume 24 > Issue 8 > 856-860
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GaAs MESFET可靠性及快速评价新方法的研究

李志国 , 宋增超 , 孙大鹏 , 程尧海 , 张万荣 and 周仲蓉

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Key words: GaAs FET, 失效机理, 快速评价

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    Received: 20 August 2015 Revised: Online: Published: 01 August 2003

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      Article Navigation >  Journal of Semiconductors  > 2003  >  24(8): 856-860
      李志国, 宋增超, 孙大鹏, 程尧海, 张万荣, 周仲蓉. GaAs MESFET可靠性及快速评价新方法的研究[J]. 半导体学报(英文版), 2003, 24(8): 856-860.
      Citation:
      李志国, 宋增超, 孙大鹏, 程尧海, 张万荣, 周仲蓉. GaAs MESFET可靠性及快速评价新方法的研究[J]. 半导体学报(英文版), 2003, 24(8): 856-860.
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      • Received Date: 2015-08-20

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