Chin. J. Semicond. > 1985, Volume 6 > Issue 3 > 268-274
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微处理器测试图案产生方法研究

李云岗 and 林雨

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    Received: 20 August 2015 Revised: Online: Published: 01 March 1985

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      Article Navigation >  Journal of Semiconductors  > 1985  >  6(3): 268-274
      李云岗, 林雨. 微处理器测试图案产生方法研究[J]. 半导体学报(英文版), 1985, 6(3): 268-274.
      Citation:
      李云岗, 林雨. 微处理器测试图案产生方法研究[J]. 半导体学报(英文版), 1985, 6(3): 268-274.
      shu

      • Received Date: 2015-08-20

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