Chin. J. Semicond. > 1987, Volume 8 > Issue 5 > 512-519
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亚带隙表面光电压谱测定界面态性质

张坚 and 黄炳忠

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    Received: 19 August 2015 Revised: Online: Published: 01 May 1987

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      Article Navigation >  Journal of Semiconductors  > 1987  >  8(5): 512-519
      张坚, 黄炳忠. 亚带隙表面光电压谱测定界面态性质[J]. 半导体学报(英文版), 1987, 8(5): 512-519.
      Citation:
      张坚, 黄炳忠. 亚带隙表面光电压谱测定界面态性质[J]. 半导体学报(英文版), 1987, 8(5): 512-519.
      shu

      • Received Date: 2015-08-19

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