Chin. J. Semicond. > 1998, Volume 19 > Issue 1 > 61-65

Structural Investigation of InGaAs/InP Quantum Wire Array Using Triple-Axis X-ray Diffractometry

马文全 , 王玉田 , 庄岩 , 江德生 , 朱洪亮 , 张静媛 , 段俐宏 and 王圩

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Received: 20 August 2015 Revised: Online: Published: 01 January 1998

Article Navigation > Journal of Semiconductors > 1998 > 19(1): 61-65

马文全, 王玉田, 庄岩, 江德生, 朱洪亮, 张静媛, 段俐宏, 王圩. Structural Investigation of InGaAs/InP Quantum Wire Array Using Triple-Axis X-ray Diffractometry[J]. 半导体学报(英文版), 1998, 19(1): 61-65.

Citation:

马文全, 王玉田, 庄岩, 江德生, 朱洪亮, 张静媛, 段俐宏, 王圩. Structural Investigation of InGaAs/InP Quantum Wire Array Using Triple-Axis X-ray Diffractometry[J]. 半导体学报(英文版), 1998, 19(1): 61-65.

马文全, 王玉田, 庄岩, 江德生, 朱洪亮, 张静媛, 段俐宏, 王圩. Structural Investigation of InGaAs/InP Quantum Wire Array Using Triple-Axis X-ray Diffractometry[J]. 半导体学报(英文版), 1998, 19(1): 61-65.

Citation:

马文全, 王玉田, 庄岩, 江德生, 朱洪亮, 张静媛, 段俐宏, 王圩. Structural Investigation of InGaAs/InP Quantum Wire Array Using Triple-Axis X-ray Diffractometry[J]. 半导体学报(英文版), 1998, 19(1): 61-65.

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