Chin. J. Semicond. > 2002, Volume 23 > Issue 5 > 550-554
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判断瞬态热场快速算法结果正确性的快捷方法

张鸿欣

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Key words: 可靠性, 热模拟, 微波功率器件

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    Received: 19 August 2015 Revised: Online: Published: 01 May 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(5): 550-554
      张鸿欣. 判断瞬态热场快速算法结果正确性的快捷方法[J]. 半导体学报(英文版), 2002, 23(5): 550-554.
      Citation:
      张鸿欣. 判断瞬态热场快速算法结果正确性的快捷方法[J]. 半导体学报(英文版), 2002, 23(5): 550-554.
      shu

      • Received Date: 2015-08-19

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