Chin. J. Semicond. > 1999, Volume 20 > Issue 7 > 562-568
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高温退火时化学计量比偏离对GaAs晶体气固相平衡的影响

赵福川 , 夏冠群 , 杜立新 , 谈惠祖 and 莫培根

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    Received: 20 August 2015 Revised: Online: Published: 01 July 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(7): 562-568
      赵福川, 夏冠群, 杜立新, 谈惠祖, 莫培根. 高温退火时化学计量比偏离对GaAs晶体气固相平衡的影响[J]. 半导体学报(英文版), 1999, 20(7): 562-568.
      Citation:
      赵福川, 夏冠群, 杜立新, 谈惠祖, 莫培根. 高温退火时化学计量比偏离对GaAs晶体气固相平衡的影响[J]. 半导体学报(英文版), 1999, 20(7): 562-568.
      shu

      • Received Date: 2015-08-20

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