Chin. J. Semicond. > 1995, Volume 16 > Issue 12 > 909-912
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~（60）CO－γ辐照感生Si／SiO_2慢界面态及其对高频C－V测试的影响

高文钰，严荣良，任迪远

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    Received: 19 August 2015 Revised: Online: Published: 01 December 1995

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      Article Navigation >  Journal of Semiconductors  > 1995  >  16(12): 909-912
      高文钰，严荣良，任迪远. ~（60）CO－γ辐照感生Si／SiO_2慢界面态及其对高频C－V测试的影响[J]. 半导体学报(英文版), 1995, 16(12): 909-912.
      Citation:
      高文钰，严荣良，任迪远. ~（60）CO－γ辐照感生Si／SiO_2慢界面态及其对高频C－V测试的影响[J]. 半导体学报(英文版), 1995, 16(12): 909-912.
      shu

      • Received Date: 2015-08-19

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