Chin. J. Semicond. > 2005, Volume 26 > Issue 7 > 1359-1363
|

CONTENTS

Si/SiGe/Si-SOI异质结构的同步辐射双晶貌相术和高分辨三轴晶X射线衍射

马通达 , 屠海令 , 胡广勇 , 邵贝羚 and 刘安生

+ Author Affiliations

PDF

Key words: 同步辐射双晶貌相术, 高分辨三轴晶X射线衍射, 衍射双峰

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2633 Times PDF downloads: 1556 Times Cited by: 0 Times

    History

    Received: 18 August 2015 Revised: Online: Published: 01 July 2005

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2005  >  26(7): 1359-1363
      马通达, 屠海令, 胡广勇, 邵贝羚, 刘安生. Si/SiGe/Si-SOI异质结构的同步辐射双晶貌相术和高分辨三轴晶X射线衍射[J]. 半导体学报(英文版), 2005, 26(7): 1359-1363.
      Citation:
      马通达, 屠海令, 胡广勇, 邵贝羚, 刘安生. Si/SiGe/Si-SOI异质结构的同步辐射双晶貌相术和高分辨三轴晶X射线衍射[J]. 半导体学报(英文版), 2005, 26(7): 1359-1363.
      shu

      • Received Date: 2015-08-18

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return