Chin. J. Semicond. > 1980, Volume 1 > Issue 3 > 254-256

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光电压光谱法测定磷砷化镓外延层的组成(二)

邱德仁 and 汪乃兴

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    Received: 20 August 2015 Revised: Online: Published: 01 March 1980

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      Article Navigation >  Journal of Semiconductors  > 1980  >  1(3): 254-256
      邱德仁, 汪乃兴. 光电压光谱法测定磷砷化镓外延层的组成(二)[J]. 半导体学报(英文版), 1980, 1(3): 254-256.
      Citation:
      邱德仁, 汪乃兴. 光电压光谱法测定磷砷化镓外延层的组成(二)[J]. 半导体学报(英文版), 1980, 1(3): 254-256.
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      • Received Date: 2015-08-20

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