Chin. J. Semicond. > 1997, Volume 18 > Issue 8 > 598-602
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用Van der Pauw法研究硼重掺杂金刚石薄膜电学性质

陈光华 , 张兴旺 and 季亚英

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    Received: 19 August 2015 Revised: Online: Published: 01 August 1997

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      Article Navigation >  Journal of Semiconductors  > 1997  >  18(8): 598-602
      陈光华, 张兴旺, 季亚英. 用Van der Pauw法研究硼重掺杂金刚石薄膜电学性质[J]. 半导体学报(英文版), 1997, 18(8): 598-602.
      Citation:
      陈光华, 张兴旺, 季亚英. 用Van der Pauw法研究硼重掺杂金刚石薄膜电学性质[J]. 半导体学报(英文版), 1997, 18(8): 598-602.
      shu

      • Received Date: 2015-08-19

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