Chin. J. Semicond. > 1986, Volume 7 > Issue 4 > 441-445
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光电化学法测量N型半导体材料扩散长度

邵永富 and 陈自姚

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    Received: 20 August 2015 Revised: Online: Published: 01 April 1986

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      Article Navigation >  Journal of Semiconductors  > 1986  >  7(4): 441-445
      邵永富, 陈自姚. 光电化学法测量N型半导体材料扩散长度[J]. 半导体学报(英文版), 1986, 7(4): 441-445.
      Citation:
      邵永富, 陈自姚. 光电化学法测量N型半导体材料扩散长度[J]. 半导体学报(英文版), 1986, 7(4): 441-445.
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      • Received Date: 2015-08-20

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