Chin. J. Semicond. > 1994, Volume 15 > Issue 6 > 409-415
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硅锗分子束外延层表面形貌的扫描隧道显微镜研究

周铁城，蔡群，朱昂如，董树忠，盛篪，俞鸣人，张翔龙，王迅

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    Received: 18 August 2015 Revised: Online: Published: 01 June 1994

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      Article Navigation >  Journal of Semiconductors  > 1994  >  15(6): 409-415
      周铁城，蔡群，朱昂如，董树忠，盛篪，俞鸣人，张翔龙，王迅. 硅锗分子束外延层表面形貌的扫描隧道显微镜研究[J]. 半导体学报(英文版), 1994, 15(6): 409-415.
      Citation:
      周铁城，蔡群，朱昂如，董树忠，盛篪，俞鸣人，张翔龙，王迅. 硅锗分子束外延层表面形貌的扫描隧道显微镜研究[J]. 半导体学报(英文版), 1994, 15(6): 409-415.
      shu

      • Received Date: 2015-08-18

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