Chin. J. Semicond. > 2000, Volume 21 > Issue 2 > 120-126
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纳米结构器件材料结构参数的新测试方法

薛舫时

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Key words: 纳米结构, 结构参数, 测试方法, 理论计算

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    Received: 20 August 2015 Revised: Online: Published: 01 February 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(2): 120-126
      薛舫时. 纳米结构器件材料结构参数的新测试方法[J]. 半导体学报(英文版), 2000, 21(2): 120-126.
      Citation:
      薛舫时. 纳米结构器件材料结构参数的新测试方法[J]. 半导体学报(英文版), 2000, 21(2): 120-126.
      shu

      • Received Date: 2015-08-20

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