Chin. J. Semicond. > 2004, Volume 25 > Issue 1 > 43-47
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退火对GaAs窗口晶体力学性能的影响

黎建明 , 屠海令 and 郑安生

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Key words: GaAs, 断裂模数, 退火

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    Received: 19 August 2015 Revised: Online: Published: 01 January 2004

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      Article Navigation >  Journal of Semiconductors  > 2004  >  25(1): 43-47
      黎建明, 屠海令, 郑安生. 退火对GaAs窗口晶体力学性能的影响[J]. 半导体学报(英文版), 2004, 25(1): 43-47.
      Citation:
      黎建明, 屠海令, 郑安生. 退火对GaAs窗口晶体力学性能的影响[J]. 半导体学报(英文版), 2004, 25(1): 43-47.
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      • Received Date: 2015-08-19

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