Citation: |
Zhou Xincui, Ye Zhizhen, Chen Fugang, Xu Weizhong, Miao Yan, Huang Jingyun, Lü Jianguo, Zhu Liping, Zhao Binghui. Growth of Phosphorus-Doped p-Type ZnO Thin Films by MOCVD[J]. Journal of Semiconductors, 2006, 27(1): 91-95.
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Zhou X C, Ye Z Z, Chen F G, Xu W Z, Miao Y, Huang J Y, Lü J, Zhu L P, Zhao B H. Growth of Phosphorus-Doped p-Type ZnO Thin Films by MOCVD[J]. Chin. J. Semicond., 2006, 27(1): 91.
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Growth of Phosphorus-Doped p-Type ZnO Thin Films by MOCVD
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Abstract
Phosphorus-doped p-type ZnO thin films are prepared on glass substrates by metalorganic chemical vapor deposition.DEZn,O2,and P2O5 powder are used as reactant and dopant sources.The p-type ZnO films are grown at a temperature between 400 and 450℃.The best p-type sample has a low resistivity of 4.64Ω·cm,a hole concentration of 1.61×1018cm-3,and a Hall mobility of 0.838cm2/(V·s) at room temperature.A strong emission peak at 3.354eV corresponding to neutral acceptor bound excitons is observed at 77K in the photoluminescence spectra,further verifying the p-type characteristics of the films -
References
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