Chin. J. Semicond. > 2000, Volume 21 > Issue 3 > 280-285
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MCT关断失效分析

张鹤鸣 , 戴显英 and 王伟

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Key words: MCT, 关断, 失效分析

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    Received: 20 August 2015 Revised: Online: Published: 01 March 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(3): 280-285
      张鹤鸣, 戴显英, 王伟. MCT关断失效分析[J]. 半导体学报(英文版), 2000, 21(3): 280-285.
      Citation:
      张鹤鸣, 戴显英, 王伟. MCT关断失效分析[J]. 半导体学报(英文版), 2000, 21(3): 280-285.
      shu

      • Received Date: 2015-08-20

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