Chin. J. Semicond. > 2000, Volume 21 > Issue 5 > 469-472
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N-掺杂浓度对小尺寸nMOSFETs热载流子寿命的影响

张炯 and 李瑞伟

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Key words: 热载流子, 寿命, MOS

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    Received: 20 August 2015 Revised: Online: Published: 01 May 2000

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      Article Navigation >  Journal of Semiconductors  > 2000  >  21(5): 469-472
      张炯, 李瑞伟. N-掺杂浓度对小尺寸nMOSFETs热载流子寿命的影响[J]. 半导体学报(英文版), 2000, 21(5): 469-472.
      Citation:
      张炯, 李瑞伟. N-掺杂浓度对小尺寸nMOSFETs热载流子寿命的影响[J]. 半导体学报(英文版), 2000, 21(5): 469-472.
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      • Received Date: 2015-08-20

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