Chin. J. Semicond. > 1980, Volume 1 > Issue 4 > 274-279
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掺Te-GaAs单晶中微缺陷的透射电镜研究

范缇文 , 何宏家 , 白玉珂 and 费雪英

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    Received: 20 August 2015 Revised: Online: Published: 01 April 1980

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      Article Navigation >  Journal of Semiconductors  > 1980  >  1(4): 274-279
      范缇文, 何宏家, 白玉珂, 费雪英. 掺Te-GaAs单晶中微缺陷的透射电镜研究[J]. 半导体学报(英文版), 1980, 1(4): 274-279.
      Citation:
      范缇文, 何宏家, 白玉珂, 费雪英. 掺Te-GaAs单晶中微缺陷的透射电镜研究[J]. 半导体学报(英文版), 1980, 1(4): 274-279.
      shu

      • Received Date: 2015-08-20

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