Chin. J. Semicond. > 1983, Volume 4 > Issue 1 > 86-89
|

CONTENTS

光荧光法测定硅中磷、硼含量

孟庆惠 , 于鲲 , 李永康 , 许振嘉 , 陈廷杰 , 吴灵犀 and 徐寿定

+ Author Affiliations

PDF

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2459 Times PDF downloads: 970 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 January 1983

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 1983  >  4(1): 86-89
      孟庆惠, 于鲲, 李永康, 许振嘉, 陈廷杰, 吴灵犀, 徐寿定. 光荧光法测定硅中磷、硼含量[J]. 半导体学报(英文版), 1983, 4(1): 86-89.
      Citation:
      孟庆惠, 于鲲, 李永康, 许振嘉, 陈廷杰, 吴灵犀, 徐寿定. 光荧光法测定硅中磷、硼含量[J]. 半导体学报(英文版), 1983, 4(1): 86-89.
      shu

      • Received Date: 2015-08-20

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return