Citation: |
Xiong Chenrong, Wang Minsheng, Huang Wentao, Chen Peiyi, Wang Yan, Luo Guangli. P-Type Si/Sige resonant Tunnelling diodes[J]. Journal of Semiconductors, 2003, 24(S1): 128-131.
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Xiong C R, Wang M S, Huang W T, Chen P Y, Wang Y, Luo G L. P-Type Si/Sige resonant Tunnelling diodes[J]. Chin. J. Semicond., 2003, 24(S1): 128.
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P-Type Si/Sige resonant Tunnelling diodes
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Abstract
P-type double-barrier quantum well resonant tunnelling diodes is realiZed by ultra high vacuum epitaxy tool GS400. A peak to valley current ratio of 1. 13 and a peak current density of 1. 589kA/cm2 at room temperature ( 293K D from continuous dc current-voltage measurements are recorded while at 77K With pulsed current-voltage measurements the corresponding values are 1. 24 and 1. 086kA/cm2 . The loW PVCR in both cases are attributed to the energy band features and thermal effects of Si1-IGeI/Si heterostructures.-
Keywords:
- RTDs
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References
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Proportional views