Chin. J. Semicond. > 2005, Volume 26 > Issue 9 > 1848-1853
|

CONTENTS

一种DC-DC芯片内建可测性设计

王红义 , 来新泉 , 李玉山 and 陈富吉

+ Author Affiliations

PDF

Key words: 电源管理, DC-DC, 可测性设计, 内建测试电路

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2576 Times PDF downloads: 1557 Times Cited by: 0 Times

    History

    Received: 18 August 2015 Revised: Online: Published: 01 September 2005

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2005  >  26(9): 1848-1853
      王红义, 来新泉, 李玉山, 陈富吉. 一种DC-DC芯片内建可测性设计[J]. 半导体学报(英文版), 2005, 26(9): 1848-1853.
      Citation:
      王红义, 来新泉, 李玉山, 陈富吉. 一种DC-DC芯片内建可测性设计[J]. 半导体学报(英文版), 2005, 26(9): 1848-1853.
      shu

      • Received Date: 2015-08-18

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return