Chin. J. Semicond. > 2003, Volume 24 > Issue 12 > 1307-1311
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一种精确检测半导体二极管正向电特性的新方法

王存达 , 曾志斌 , 张国义 , 沈君 and 朱传云

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Key words: 半导体二极管, 正向电特性, 串联模式, 界面层, 负电容

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    Received: 20 August 2015 Revised: Online: Published: 01 December 2003

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      Article Navigation >  Journal of Semiconductors  > 2003  >  24(12): 1307-1311
      王存达, 曾志斌, 张国义, 沈君, 朱传云. 一种精确检测半导体二极管正向电特性的新方法[J]. 半导体学报(英文版), 2003, 24(12): 1307-1311.
      Citation:
      王存达, 曾志斌, 张国义, 沈君, 朱传云. 一种精确检测半导体二极管正向电特性的新方法[J]. 半导体学报(英文版), 2003, 24(12): 1307-1311.
      shu

      • Received Date: 2015-08-20

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