Chin. J. Semicond. > 2003, Volume 24 > Issue S1 > 65-69

Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203

Xue Yuzhi and Martin A Green

+ Author Affiliations

PDF

Abstract: Al/Al203 multilayers with nanometer scale are fabricated by thermal evaporation and natural oxidization techniques. The detection of X-ray and photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS) is performed, and the curve ofei (ki ) is got. The properties of the negative resistance for the multilayers are found.

Key words: multilayers ofal/Al203 electron spectroscopy electronic properties

  • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 1891 Times PDF downloads: 516 Times Cited by: 0 Times

    History

    Received: 16 March 2016 Revised: Online: Published: 01 January 2003

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Xue Yuzhi, Martin A Green. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Journal of Semiconductors, 2003, 24(S1): 65-69. ****Xue Y Z, Martin A G. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Chin. J. Semicond., 2003, 24(S1): 65.
      Citation:
      Xue Yuzhi, Martin A Green. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Journal of Semiconductors, 2003, 24(S1): 65-69. ****
      Xue Y Z, Martin A G. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Chin. J. Semicond., 2003, 24(S1): 65.

      Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203

      • Received Date: 2016-03-16
      • Published Date: 2016-03-15

      Catalog

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return