| Citation: |
Tian Wenchao, Jia Jianyuan. Adhesive force on nanoindentation between tip ofatomic force microscopy and sample surface[J]. Journal of Semiconductors, 2003, 24(S1): 70-73.
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Tian W C, Jia J Y. Adhesive force on nanoindentation between tip ofatomic force microscopy and sample surface[J]. Chin. J. Semicond., 2003, 24(S1): 70.
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Adhesive force on nanoindentation between tip ofatomic force microscopy and sample surface
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Abstract
The nanoindention physical model ofatomic force microscopy between its tip and sample surface is established. The nanoindention adhesive force eXpression is obtained based on Hamaker hypothesizes and Lennard-Jones potential function by the continuous method. The Hamaker constant approXimate formula is established based on the principle of Lif shitz, followed by the Hamaker constant ofau, Cu, Al, Ag. The result is in agreement with experiments. -
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