Chin. J. Semicond. > 1999, Volume 20 > Issue 11 > 1004-1009
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用Franz-Keldysh效应研究GaAs表面硫化学钝化

廖友贵 , 金鹏 , 李乙钢 , 张存洲 , 潘士宏 and 梁基本

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    Received: 19 August 2015 Revised: Online: Published: 01 November 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(11): 1004-1009
      廖友贵, 金鹏, 李乙钢, 张存洲, 潘士宏, 梁基本. 用Franz-Keldysh效应研究GaAs表面硫化学钝化[J]. 半导体学报(英文版), 1999, 20(11): 1004-1009.
      Citation:
      廖友贵, 金鹏, 李乙钢, 张存洲, 潘士宏, 梁基本. 用Franz-Keldysh效应研究GaAs表面硫化学钝化[J]. 半导体学报(英文版), 1999, 20(11): 1004-1009.
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      • Received Date: 2015-08-19

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