Chin. J. Semicond. > 2007, Volume 28 > Issue 4 > 530-536

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A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques

Liu Yongpan, Yang Huazhong and Wang Hui

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Abstract: We propose a novel thermal-conscious power model for integrated circuits that can accurately predict power and temperature under voltage scaling.Experimental results show that the leakage power consumption is underestimated by 52% if thermal effects are omitted.Furthermore,an inconsistency arises when energy and temperature are simultaneously optimized by dynamic voltage scaling.Temperature is a limiting factor for future integrated circuits,and the thermal optimization approach can attain a temperature reduction of up to 12℃ with less than 1.8% energy penalty compared with the energy optimization one.

Key words: CMOS integrated circuitspower modeltemperatureDVS

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    Received: 18 August 2015 Revised: 27 November 2006 Online: Published: 01 April 2007

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      Liu Yongpan, Yang Huazhong, Wang Hui. A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques[J]. Journal of Semiconductors, 2007, 28(4): 530-536. ****Liu Y P, Yang H Z, Wang H. A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques[J]. Chin. J. Semicond., 2007, 28(4): 530.
      Citation:
      Liu Yongpan, Yang Huazhong, Wang Hui. A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques[J]. Journal of Semiconductors, 2007, 28(4): 530-536. ****
      Liu Y P, Yang H Z, Wang H. A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques[J]. Chin. J. Semicond., 2007, 28(4): 530.

      A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques

      • Received Date: 2015-08-18
      • Accepted Date: 2006-10-13
      • Revised Date: 2006-11-27
      • Published Date: 2007-04-09

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