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A Static-State Model of NPT-IGBTs with Localized Lifetime Control

Fang Jian, Jiang Huaping, Qiao Ming, Zhang Bo and Li Zhaoji

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Abstract: A static-state model of NPT-IGBTs with localized lifetime control is proposed,the results of which fit 2D simulation.With this model,the forward characteristics of localized lifetime control NPT-IGBT influenced by the parameters of localized low-lifetime region are discussed in detail.We also systematically explain why the optimized locations of low-lifetime region are different by different localized lifetime control methods in previous reports.

Key words: localized lifetime control, NPT-IGBT, forward voltage drops, conductivity modulation

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    Received: 20 August 2015 Revised: Online: Published: 01 May 2006

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      Article Navigation >  Journal of Semiconductors  > 2006  >  27(5): 857-863
      Fang Jian, Jiang Huaping, Qiao Ming, Zhang Bo, Li Zhaoji. A Static-State Model of NPT-IGBTs with Localized Lifetime Control[J]. Journal of Semiconductors, 2006, 27(5): 857-863. ****Fang J, Jiang H P, Qiao M, Zhang B, Li Z J. A Static-State Model of NPT-IGBTs with Localized Lifetime Control[J]. Chin. J. Semicond., 2006, 27(5): 857.
      Citation:
      Fang Jian, Jiang Huaping, Qiao Ming, Zhang Bo, Li Zhaoji. A Static-State Model of NPT-IGBTs with Localized Lifetime Control[J]. Journal of Semiconductors, 2006, 27(5): 857-863. ****
      Fang J, Jiang H P, Qiao M, Zhang B, Li Z J. A Static-State Model of NPT-IGBTs with Localized Lifetime Control[J]. Chin. J. Semicond., 2006, 27(5): 857.
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      A Static-State Model of NPT-IGBTs with Localized Lifetime Control

      • University of Electronic Science and Technology of China,Chengdu 610054,China

      • University of Electronic Science and Technology of China,Chengdu 610054,China

      • University of Electronic Science and Technology of China,Chengdu 610054,China

      • University of Electronic Science and Technology of China,Chengdu 610054,China

      • University of Electronic Science and Technology of China,Chengdu 610054,China

      • Received Date: 2015-08-20

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