Chin. J. Semicond. > 1997, Volume 18 > Issue 10 > 782-786
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退火对CdZnTe晶体质量的影响

朱基千 , 褚君浩 , 张小平 , 李标 and 程继健

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    Received: 19 August 2015 Revised: Online: Published: 01 October 1997

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      Article Navigation >  Journal of Semiconductors  > 1997  >  18(10): 782-786
      朱基千, 褚君浩, 张小平, 李标, 程继健. 退火对CdZnTe晶体质量的影响[J]. 半导体学报(英文版), 1997, 18(10): 782-786.
      Citation:
      朱基千, 褚君浩, 张小平, 李标, 程继健. 退火对CdZnTe晶体质量的影响[J]. 半导体学报(英文版), 1997, 18(10): 782-786.
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      • Received Date: 2015-08-19

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