| Citation: |
Liu Chao, Zhang Yali, Xu Guizhi, Zhang Tao, Hou Guanghui, Zhu Ninghua. Analysis of Operation Errors of TO-Packaged VCSELs[J]. Journal of Semiconductors, 2006, 27(8): 1480-1483.
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Liu C, Zhang Y L, Xu G Z, Zhang T, Hou G H, Zhu N H. Analysis of Operation Errors of TO-Packaged VCSELs[J]. Chin. J. Semicond., 2006, 27(8): 1480.
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Analysis of Operation Errors of TO-Packaged VCSELs
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Abstract
The dependence of the coupling efficiencies of the TO-packaged VCSELs on packaging operation errors are analyzed using FRESNEL and MATLAB.Three error sources are considered: lateral offset of chips,tilt of chips,and tilt of the TO-cap.Of these three error sources, it is found that the tilt of the TO-cap has the greatest effect on the coupling efficiency of the packaging subassemblies.-
Keywords:
- coupling efficiency,
- VCSEL,
- package
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References
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Proportional views
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