Chin. J. Semicond. > 2003, Volume 24 > Issue 7 > 729-736
|

CONTENTS

退火处理对ZnO薄膜结晶性能的影响

吕建国 , 叶志镇 , 黄靖云 , 赵炳辉 and 汪雷

+ Author Affiliations

PDF

Key words: ZnO薄膜, 退火处理, 退火模型, 结晶性能

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 3454 Times PDF downloads: 1274 Times Cited by: 0 Times

    History

    Received: 20 August 2015 Revised: Online: Published: 01 July 2003

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2003  >  24(7): 729-736
      吕建国, 叶志镇, 黄靖云, 赵炳辉, 汪雷. 退火处理对ZnO薄膜结晶性能的影响[J]. 半导体学报(英文版), 2003, 24(7): 729-736.
      Citation:
      吕建国, 叶志镇, 黄靖云, 赵炳辉, 汪雷. 退火处理对ZnO薄膜结晶性能的影响[J]. 半导体学报(英文版), 2003, 24(7): 729-736.
      shu

      • Received Date: 2015-08-20

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return