Chin. J. Semicond. > 2002, Volume 23 > Issue 11 > 1224-1227
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IC测试系统精密定时器的新结构

王东辉 , 施映 and 林雨

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Key words: IC测试, 定时器, VLSI

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    Received: 19 August 2015 Revised: Online: Published: 01 November 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(11): 1224-1227
      王东辉, 施映, 林雨. IC测试系统精密定时器的新结构[J]. 半导体学报(英文版), 2002, 23(11): 1224-1227.
      Citation:
      王东辉, 施映, 林雨. IC测试系统精密定时器的新结构[J]. 半导体学报(英文版), 2002, 23(11): 1224-1227.
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      • Received Date: 2015-08-19

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