| Citation: |
Liu Ke, 菅洪彦, Jian Hongyan, Huang Chenling, Tang Zhangwen. Suppressing of On-Chip Inductor Current Crowding by a Multi-Current-Path Method[J]. Journal of Semiconductors, 2006, 27(9): 1690-1694.
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Liu K, Jian H Y, Huang C L, Tang Z W. Suppressing of On-Chip Inductor Current Crowding by a Multi-Current-Path Method[J]. Chin. J. Semicond., 2006, 27(9): 1690.
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Suppressing of On-Chip Inductor Current Crowding by a Multi-Current-Path Method
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Abstract
From the view of the electromagnetic theory,we examine the current redistributions of an inductor.We conclude that metal with a small cross-section has a weak skin effect and that inductors with a smaller ratio of the turn width to the space between turns have a weak proximity effect.The inductors are fabricated in 0.35μm four-metal CMOS technology.A turn of the differential inductor is divided into multi-shunt tracks,which keep the symmetry of the two ports of the inductor.Compared with a single-current-path configuration,the multi-current-path inductor offers a 40% greater maximum quality factor and a narrower range of operating frequencies,which we interpret here in detail. -
References
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Proportional views
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