| Citation: |
Tu Xiaoguang, Zhao Lei, Chen Ping, Chen Shaowu, Zuo Yuhua, Yu Jinzhong, Wang Qiming. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Journal of Semiconductors, 2007, 28(7): 1012-1016.
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Tu X G, Zhao L, Chen P, Chen S W, Zuo Y H, Yu J Z, Wang Q M. Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer[J]. Chin. J. Semicond., 2007, 28(7): 1012.
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Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer
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Abstract
A polarization-maintaining (PM) fiber Mach-Zehnder (MZ) interferometer has been established to measure the EO effect of very thin film materials with optical anisotropy.Unlike a common MZ interferometer,all the components are connected via polarization-maintaining fibers.At the same time,a polarized DFB laser with a maximum power output of 10mW is adopted as the light source to induce a large extinction ratio.Here,we take it to determine the electro-optical coefficients of a very thin superlattice structure with GaAs,KTP,and GaN as comparative samples.The measured EO coefficients show good comparability with the others. -
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